Last year we realized a new multimodal system, which includes several microscopy techniques working in far field or in near field. Our new multimodal system integrated several label free microscopy techniques which offer the possibility for investigations at micro and nanoscale by using the far field and near field imagining. Correlated images on the same areas are presented. By using a scattering near field optical module (s-SNOM) upgrading an atomic force microscope (AFM) we are able to image simultaneously the topography as well as the amplitude and phase of the optical signals. The best resolution was less than 10 nm and it is connected with the tip size of the AFM. Polarization-resolved second harmonic generation microscopy as well second harmonic imaging techniques based on the far field and near field are also integrated in the system. All techniques upgraded a confocal scanning laser microscope. Some of our results on the biological samples by using complementary techniques are presented.
Topic（题目）：SUPERESOLUTION IN LASER MICROSCOPY TECHNIQUES BASED ON FAR FIELD AND NEAR FIELD
Speaker（报告人）:George A. Stanciu
(Center for Microscopy-Microanalysis and Information Processing, University Politehnica of Bucharest, Romania)
Abstract（摘要）：Related techniques based on laser scanning microscopy represent very important tools for different optical investigations in Life sciences and in Material sciences fields. The techniques are totally noninvasive and lately they reached the nano resolution.
E-mail: firstname.lastname@example.org, web:www.cmmip-upb.org